Topic: GOES-16 SEISS MPS-LO Electron and Ion Microchannel Plate (MCP) HV Bias Calibration (impacts SEISS)

Date/Time Issued: October 09, 2020 1458Z

Product(s) or Data Impacted: GOES-16 SEISS MPS-LO

Date/Time of Initial Impact: October 14, 2020 1400Z

Date/Time of Expected End: October 15, 2020 1600Z

Length of Outage: 26 hours of product degradation

Details/Specifics of Change:

A GOES-16 (GOES-EAST) SEISS MPS-LO Electron and Ion Microchannel Plate (MCP) HV Bias Calibration will be performed from 2020/288T14:00z to 2020/289T16:00z. The calibration will consist of 2 hours of commanding followed by a 24 hour power off of the MPS-LO Deflection Electrode High Voltage (required for performance data collection). SEISS MPS-LO will experience data degradation during this 26 hour period until the Deflection Electrode High Voltage is powered back on returning the sensor to nominal operation.

The SEISS MPS-LO Calibration will be cancelled due to CWD or if the Space Weather environment is not appropriate for the calibration.

Contact Information for Further Information: ESPC Operations at ESPCOperations@noaa.gov or 301-817-3880

GOES Payload Engineering: 301-817-4409

Web Site(s) for applicable information: N/A

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